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HE XIANYUN;CHONG PEIJI Institute of Atomic Energy. P.O. Box. 275, Beijing. THE ELECTROMIGRATION OF ~(153,154)Eu ON CAM[J]. Atomic Energy Science and Technology, 1986, 20(3): 336-336. DOI: 10.7538/yzk.1986.20.03.0336
Citation: HE XIANYUN;CHONG PEIJI Institute of Atomic Energy. P.O. Box. 275, Beijing. THE ELECTROMIGRATION OF ~(153,154)Eu ON CAM[J]. Atomic Energy Science and Technology, 1986, 20(3): 336-336. DOI: 10.7538/yzk.1986.20.03.0336
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  • The electromigration of ~(153,154)Eu was studied with CAM as the supportingmaterial. The factors influencing the migration were investigated, including elec-tric field intensity, consentration and pH of the electrolyte, ionic strength andtemperature. The stability constant of EuR~(2+) complex and its electromobilitywere determined to be 1549 and 1.2×10~(-7)cm~2/s.V respectively under the followingconditions: α--HIBA = 0.4 M, μ = 0.01, Voltage = 1000V.
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