XING JINGYUAN;CHENG SHIYUAN Institute of Atomic Energy, P. O. Box 275, Beijing. NANOSECOND TIME MEASURMENTS OF SINGLE PULSE[J]. Atomic Energy Science and Technology, 1986, 20(4): 466-466. DOI: 10.7538/yzk.1986.20.04.0466
Citation:
XING JINGYUAN;CHENG SHIYUAN Institute of Atomic Energy, P. O. Box 275, Beijing. NANOSECOND TIME MEASURMENTS OF SINGLE PULSE[J]. Atomic Energy Science and Technology, 1986, 20(4): 466-466. DOI: 10.7538/yzk.1986.20.04.0466
XING JINGYUAN;CHENG SHIYUAN Institute of Atomic Energy, P. O. Box 275, Beijing. NANOSECOND TIME MEASURMENTS OF SINGLE PULSE[J]. Atomic Energy Science and Technology, 1986, 20(4): 466-466. DOI: 10.7538/yzk.1986.20.04.0466
Citation:
XING JINGYUAN;CHENG SHIYUAN Institute of Atomic Energy, P. O. Box 275, Beijing. NANOSECOND TIME MEASURMENTS OF SINGLE PULSE[J]. Atomic Energy Science and Technology, 1986, 20(4): 466-466. DOI: 10.7538/yzk.1986.20.04.0466
This report describes mainly the circuit design principle specification andtime--interval calibrations of model SHS 500 time--to--digital converter. Its rangeis 12 to 500 ns, with six ranges: 50,100, 200, 300, 400 and 500 ns. The precisionof measured time--interval is 0.3% of full scale and time resolution is 0.1% offull scale.