THE THICKNESS MEASUREMENTS OF TARGETS WITH SPECTROPHOTOMETER

XU GUOJI;MENG XIANGJIN;LUO XINGHUA Institute of Atomic Energy, P. O. Box 275, Beijing

doi:10.7538/yzk.1989.23.01.0032

期刊创办：钱三强

刊名题字：郭沫若

XU GUOJI;MENG XIANGJIN;LUO XINGHUA Institute of Atomic Energy, P. O. Box 275, Beijing. THE THICKNESS MEASUREMENTS OF TARGETS WITH SPECTROPHOTOMETER[J]. Atomic Energy Science and Technology, 1989, 23(1): 32-32. DOI: 10.7538/yzk.1989.23.01.0032

Citation:

XU GUOJI;MENG XIANGJIN;LUO XINGHUA Institute of Atomic Energy, P. O. Box 275, Beijing. THE THICKNESS MEASUREMENTS OF TARGETS WITH SPECTROPHOTOMETER[J]. Atomic Energy Science and Technology, 1989, 23(1): 32-32. DOI: 10.7538/yzk.1989.23.01.0032

Citation:

XU GUOJI;MENG XIANGJIN;LUO XINGHUA Institute of Atomic Energy, P. O. Box 275, Beijing. THE THICKNESS MEASUREMENTS OF TARGETS WITH SPECTROPHOTOMETER[J]. Atomic Energy Science and Technology, 1989, 23(1): 32-32. DOI: 10.7538/yzk.1989.23.01.0032

THE THICKNESS MEASUREMENTS OF TARGETS WITH SPECTROPHOTOMETER

XU GUOJI;MENG XIANGJIN;LUO XINGHUA Institute of Atomic Energy, P. O. Box 275, Beijing

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A method for measuring the thickness of thin targets with a spectrophotometeris described. The principle of the method and the instrument used are mentioned.The relation between thickness and absorption for carbon, gold and copper foilsare given.

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THE THICKNESS MEASUREMENTS OF TARGETS WITH SPECTROPHOTOMETER

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