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DU HONGSHAN;LIANG DONGQI;WANG YUSHENG;GUO CHUNSHENG;LI JUNLAN China Institute of Atomic Energy, P. O. Box 275, Beijing. INTERCOMPARISON OF MEASUREMENTS FOR THE THICKNESS OF ULTRA THIN SOURCES AND DEPOSITED FOILS[J]. Atomic Energy Science and Technology, 1990, 24(4): 37-37. DOI: 10.7538/yzk.1990.24.04.0037
Citation: DU HONGSHAN;LIANG DONGQI;WANG YUSHENG;GUO CHUNSHENG;LI JUNLAN China Institute of Atomic Energy, P. O. Box 275, Beijing. INTERCOMPARISON OF MEASUREMENTS FOR THE THICKNESS OF ULTRA THIN SOURCES AND DEPOSITED FOILS[J]. Atomic Energy Science and Technology, 1990, 24(4): 37-37. DOI: 10.7538/yzk.1990.24.04.0037
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INTERCOMPARISON OF MEASUREMENTS FOR THE THICKNESS OF ULTRA THIN SOURCES AND DEPOSITED FOILS

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  • Received Date: July 22, 1987
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  • Intercomparison of measurements for the thickness of ultra thin sources anddeposited foils prepared by vacuum evaporation method has been made by meansof the gravimetric, the electron spectrometric analysis and the backscatteringmethods respectively. The results agree with the values obtained with the quartz-crystal micro-balance of Model SF-3. It is proved then that quartz-crystalmicro-balance of Model SF-3 is a reliable tool for the thickness measurements ofultra thin sources and deposited foils prepared with the vacuum evaporationtechnique.
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    • References (6)
  • [1]
    Van der Eijk, W. et al., Nucl. Instrum. Methods, 112, 343 (1973).
    [2]
    Parker, W. et al., Nucl. Inetrum. and Methods, 7, 22 (1960).
    [3]
    Parker, W. C. and Slatis, H., Alpha-, beta-and gamma--ray spectroscopy (ed. k. siegbahn; North-Holl and publ. Co., Amsterdam, 1965), p. 379.
    [4]
    杜鸿善等,~(170) Tm内转换电子源研制,原子能科学技术,待发表.
    [5]
    梁东麒等,中国原子能研究院年报,19页,1983年.
    [6]
    Kan Chu, W. et al., Backscattering spectrometry, Academic press, New York, 1978, p. 144．
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