XU GUOJI;MENG XIANGJIN;LUO XINGHUA;GUAN SHOUREN China Institute of Atomic Energy, P. O. Box 275, Beijing. THICKNESS AND UNIFORMITY MEASUREMENTS OF NUCLEAR TARGETS[J]. Atomic Energy Science and Technology, 1991, 25(3): 34-34. DOI: 10.7538/yzk.1991.25.03.0034
Citation: XU GUOJI;MENG XIANGJIN;LUO XINGHUA;GUAN SHOUREN China Institute of Atomic Energy, P. O. Box 275, Beijing. THICKNESS AND UNIFORMITY MEASUREMENTS OF NUCLEAR TARGETS[J]. Atomic Energy Science and Technology, 1991, 25(3): 34-34. DOI: 10.7538/yzk.1991.25.03.0034
  • The paper introduces the methods of target thickness and uniformity measure-ments including weighing, α-particle thickness gauge, quartz thickness gauge,optical transmittance and Rutherford backscattering. An α-particle gauging whichmeasures target thicknesses up to several μm is metioned. A fast tickness measure-ments for C, Au and Cu targets by spectrophotometer are given. A high sensitivequartz gauge which can measure minimum deposit of 0.04μg/cm~2 is described.Thickness and impurity determinations by RBS with accuracy better than 5% aresummarized.
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