XIAO WENMING;SHEN SHUIQING;LI HUIJUN China Institute of Atomic Energy, P.O. Box 275, Beijing. THE STUDY ON THE IONIZATION CHAMBER FOR THICKNESS MEASUREMENT[J]. Atomic Energy Science and Technology, 1991, 25(6): 74-74. DOI: 10.7538/yzk.1991.25.06.0074
Citation:
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XIAO WENMING;SHEN SHUIQING;LI HUIJUN China Institute of Atomic Energy, P.O. Box 275, Beijing. THE STUDY ON THE IONIZATION CHAMBER FOR THICKNESS MEASUREMENT[J]. Atomic Energy Science and Technology, 1991, 25(6): 74-74. DOI: 10.7538/yzk.1991.25.06.0074
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XIAO WENMING;SHEN SHUIQING;LI HUIJUN China Institute of Atomic Energy, P.O. Box 275, Beijing. THE STUDY ON THE IONIZATION CHAMBER FOR THICKNESS MEASUREMENT[J]. Atomic Energy Science and Technology, 1991, 25(6): 74-74. DOI: 10.7538/yzk.1991.25.06.0074
Citation:
|
XIAO WENMING;SHEN SHUIQING;LI HUIJUN China Institute of Atomic Energy, P.O. Box 275, Beijing. THE STUDY ON THE IONIZATION CHAMBER FOR THICKNESS MEASUREMENT[J]. Atomic Energy Science and Technology, 1991, 25(6): 74-74. DOI: 10.7538/yzk.1991.25.06.0074
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