ANALYSIS OF USING PROTONS IN SECONDARY BEAM ON BEPC AS A PARTICLE SOURCE IN SINGLE EVENT EFFECTS EXPERIMENT STUDY

doi:10.7538/yzk.1998.32.S1.0002

期刊创办：钱三强

刊名题字：郭沫若

ANALYSIS OF USING PROTONS IN SECONDARY BEAM ON BEPC AS A PARTICLE SOURCE IN SINGLE EVENT EFFECTS EXPERIMENT STUDY[J]. Atomic Energy Science and Technology, 1998, 32(S1): 2-10. DOI: 10.7538/yzk.1998.32.S1.0002

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ANALYSIS OF USING PROTONS IN SECONDARY BEAM ON BEPC AS A PARTICLE SOURCE IN SINGLE EVENT EFFECTS EXPERIMENT STUDY[J]. Atomic Energy Science and Technology, 1998, 32(S1): 2-10. DOI: 10.7538/yzk.1998.32.S1.0002

Citation:

ANALYSIS OF USING PROTONS IN SECONDARY BEAM ON BEPC AS A PARTICLE SOURCE IN SINGLE EVENT EFFECTS EXPERIMENT STUDY[J]. Atomic Energy Science and Technology, 1998, 32(S1): 2-10. DOI: 10.7538/yzk.1998.32.S1.0002

ANALYSIS OF USING PROTONS IN SECONDARY BEAM ON BEPC AS A PARTICLE SOURCE IN SINGLE EVENT EFFECTS EXPERIMENT STUDY

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ANALYSIS OF USING PROTONS IN SECONDARY BEAM ON BEPC AS A PARTICLE SOURCE IN SINGLE EVENT EFFECTS EXPERIMENT STUDY

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