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ZHANG Quan shi, LI Yin ming, CHANG Yong fu, YAN Chun guang, LI Wei (Northwest Institute of Nuclear Technology, Xi'an 710024, China). Measurements of the KX-ray Emission Probabilities of ~(75)Se and ~(113)Sn[J]. Atomic Energy Science and Technology, 2000, 34(5): 422-422. DOI: 10.7538/yzk.2000.34.05.0422
Citation: ZHANG Quan shi, LI Yin ming, CHANG Yong fu, YAN Chun guang, LI Wei (Northwest Institute of Nuclear Technology, Xi'an 710024, China). Measurements of the KX-ray Emission Probabilities of ~(75)Se and ~(113)Sn[J]. Atomic Energy Science and Technology, 2000, 34(5): 422-422. DOI: 10.7538/yzk.2000.34.05.0422
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  • Si(Li) detector efficiency in 5～40 keV is calibrated with the KX ray emitted from the calibration sources, 54 Mn, 57 Co, 65 Zn, 85 Sr, 109 Cd, 137 Cs and the I (KX)/ I (γ) method. Uncertainty of the efficiency is less than 2 %. The KX ray emission probabilities of 75 Se and 113 Sn are measured using the Si(Li) detector. The measurement results are compared with the recommended values from CRP IAEA and other measurements.
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