Advanced Search
ZHOU Chang geng 1,2, LUO Zheng ming 1, AN Zhu 1, TANG Chang huan 1 (1. Institute of Nuclear Science and Technology, Sichuan University,Chengdu 610064, China; 2. Institute of Nuclear Physics and Chemistry, Chinese Academy of Engineering Physics, Mianyang 621900, China). Measurement of K-shell Ionization Cross Sections Caused by Electron Impact Using a Method of Thin Target With Thick Substrate[J]. Atomic Energy Science and Technology, 2001, 35(2): 169-169. DOI: 10.7538/yzk.2001.35.02.0169
Citation: ZHOU Chang geng 1,2, LUO Zheng ming 1, AN Zhu 1, TANG Chang huan 1 (1. Institute of Nuclear Science and Technology, Sichuan University,Chengdu 610064, China; 2. Institute of Nuclear Physics and Chemistry, Chinese Academy of Engineering Physics, Mianyang 621900, China). Measurement of K-shell Ionization Cross Sections Caused by Electron Impact Using a Method of Thin Target With Thick Substrate[J]. Atomic Energy Science and Technology, 2001, 35(2): 169-169. DOI: 10.7538/yzk.2001.35.02.0169
shu
    Graphical Abstract
    • Abstract
  • K shell ionization cross sections of Ti and V elements from the measured result of K α X rays using the spectrometer are derived. In order to overcome the difficulties in preparing thin target, a new method of thin target with thick substrate is used. The influence of electrons reflected from the aluminium substrate is corrected by a electron transport calculation.The measurement data from this work are compared with calculation result of semiempirical formula of Green et al, and measurement data of Jessenberger et al.
    • FullText(HTML)
  • loading
    • References (7)
    • Related Articles

Catalog

    Turn off MathJax
    Article Contents

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return