ZHANG Qing xiang 1, YANG Zhao ming 1, LI Zhi chang 2, LI Shu yuan 2, JIANG Hua 2 (1 Lanzhou Institute of Physics, Lanzhou 730000, China; 2 China Institute of Atomic Energy, P. O. Box 275 10 Beijing 102413, China). Experimental Investigation of Single-word Multiple Upsets(SMU) in Commercial Static RAMs[J]. Atomic Energy Science and Technology, 2001, 35(6): 485-485. DOI: 10.7538/yzk.2001.35.06.0485
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Citation:
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ZHANG Qing xiang 1, YANG Zhao ming 1, LI Zhi chang 2, LI Shu yuan 2, JIANG Hua 2 (1 Lanzhou Institute of Physics, Lanzhou 730000, China; 2 China Institute of Atomic Energy, P. O. Box 275 10 Beijing 102413, China). Experimental Investigation of Single-word Multiple Upsets(SMU) in Commercial Static RAMs[J]. Atomic Energy Science and Technology, 2001, 35(6): 485-485. DOI: 10.7538/yzk.2001.35.06.0485
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ZHANG Qing xiang 1, YANG Zhao ming 1, LI Zhi chang 2, LI Shu yuan 2, JIANG Hua 2 (1 Lanzhou Institute of Physics, Lanzhou 730000, China; 2 China Institute of Atomic Energy, P. O. Box 275 10 Beijing 102413, China). Experimental Investigation of Single-word Multiple Upsets(SMU) in Commercial Static RAMs[J]. Atomic Energy Science and Technology, 2001, 35(6): 485-485. DOI: 10.7538/yzk.2001.35.06.0485
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Citation:
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ZHANG Qing xiang 1, YANG Zhao ming 1, LI Zhi chang 2, LI Shu yuan 2, JIANG Hua 2 (1 Lanzhou Institute of Physics, Lanzhou 730000, China; 2 China Institute of Atomic Energy, P. O. Box 275 10 Beijing 102413, China). Experimental Investigation of Single-word Multiple Upsets(SMU) in Commercial Static RAMs[J]. Atomic Energy Science and Technology, 2001, 35(6): 485-485. DOI: 10.7538/yzk.2001.35.06.0485
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