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WANG Nan zhi, XI De xun (Physics Department, Nanjing University, Nanjing 210093, China). Unbiased Estimation Method for Raising the Uniformity of Electron Beam Scanning[J]. Atomic Energy Science and Technology, 2001, 35(6): 504-504. DOI: 10.7538/yzk.2001.35.06.0504
Citation: WANG Nan zhi, XI De xun (Physics Department, Nanjing University, Nanjing 210093, China). Unbiased Estimation Method for Raising the Uniformity of Electron Beam Scanning[J]. Atomic Energy Science and Technology, 2001, 35(6): 504-504. DOI: 10.7538/yzk.2001.35.06.0504
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Unbiased Estimation Method for Raising the Uniformity of Electron Beam Scanning

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  • The uniformity of electron beam scanning is one of the important indices of linear accelerator. Unbiased estimation is an effective method for scanning uniformity calibration. When beam stability of accelerator is considered, scanning uniformity in 90 % scanning range can be 2.3 % (normalized RMS).
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