TAO Ye zheng 1,SHAN Yu sheng 1,WANG Nai yan 1,LI Ye jun 1,GAO Huai lin 1, TANG Xiu zhang 1,ZHANG Hai feng 1,SHI Zong ren 2,XU Kun 2,XING Yu 2 (1. China Institute of Atomic Energy,P.O.Box 275 7,Beijing 102413,China; 2. China Institute of Atomic Energy,P.O.Box 275 20,Beijing 102. Measuring Ultrafast X-ray Spectrum by Single-photon Incident Method[J]. Atomic Energy Science and Technology, 2002, 36(1): 1-1. DOI: 10.7538/yzk.2002.36.01.0001
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Citation:
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TAO Ye zheng 1,SHAN Yu sheng 1,WANG Nai yan 1,LI Ye jun 1,GAO Huai lin 1, TANG Xiu zhang 1,ZHANG Hai feng 1,SHI Zong ren 2,XU Kun 2,XING Yu 2 (1. China Institute of Atomic Energy,P.O.Box 275 7,Beijing 102413,China; 2. China Institute of Atomic Energy,P.O.Box 275 20,Beijing 102. Measuring Ultrafast X-ray Spectrum by Single-photon Incident Method[J]. Atomic Energy Science and Technology, 2002, 36(1): 1-1. DOI: 10.7538/yzk.2002.36.01.0001
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TAO Ye zheng 1,SHAN Yu sheng 1,WANG Nai yan 1,LI Ye jun 1,GAO Huai lin 1, TANG Xiu zhang 1,ZHANG Hai feng 1,SHI Zong ren 2,XU Kun 2,XING Yu 2 (1. China Institute of Atomic Energy,P.O.Box 275 7,Beijing 102413,China; 2. China Institute of Atomic Energy,P.O.Box 275 20,Beijing 102. Measuring Ultrafast X-ray Spectrum by Single-photon Incident Method[J]. Atomic Energy Science and Technology, 2002, 36(1): 1-1. DOI: 10.7538/yzk.2002.36.01.0001
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Citation:
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TAO Ye zheng 1,SHAN Yu sheng 1,WANG Nai yan 1,LI Ye jun 1,GAO Huai lin 1, TANG Xiu zhang 1,ZHANG Hai feng 1,SHI Zong ren 2,XU Kun 2,XING Yu 2 (1. China Institute of Atomic Energy,P.O.Box 275 7,Beijing 102413,China; 2. China Institute of Atomic Energy,P.O.Box 275 20,Beijing 102. Measuring Ultrafast X-ray Spectrum by Single-photon Incident Method[J]. Atomic Energy Science and Technology, 2002, 36(1): 1-1. DOI: 10.7538/yzk.2002.36.01.0001
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