Study on the Interface Between Metal Uranium and Aluminum Film by Auger Electron Spectroscopy

LU Xue chao, XIAN Xiao bin, ZHANG Yong bin, WANG Xiao lin (China Academy of Engineering Physics, P.O.Box 919 71, Mianyang 621900, China)

doi:10.7538/yzk.2002.36.03.0202

Atomic Energy Science and Technology > 2002 > 36(3): 202-202. > DOI: 10.7538/yzk.2002.36.03.0202

LU Xue chao, XIAN Xiao bin, ZHANG Yong bin, WANG Xiao lin (China Academy of Engineering Physics, P.O.Box 919 71, Mianyang 621900, China). Study on the Interface Between Metal Uranium and Aluminum Film by Auger Electron Spectroscopy[J]. Atomic Energy Science and Technology, 2002, 36(3): 202-202. DOI: 10.7538/yzk.2002.36.03.0202

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Study on the Interface Between Metal Uranium and Aluminum Film by Auger Electron Spectroscopy

LU Xue chao, XIAN Xiao bin, ZHANG Yong bin, WANG Xiao lin (China Academy of Engineering Physics, P.O.Box 919 71, Mianyang 621900, China)

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Received Date: October 07, 2001

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Aluminum film on uranium is prepared using magnetron sputtering with and without circulated argon ion bombardment process. Auger electron spectroscopy (AES) analysis shows there is a significant diffusion and chemical reactions take place in the interface between metal uranium and aluminum film produced with circulated argon ion bombardment process, which results in the formation of UAl 3 and Al 2O 3 phases. The interfacial role to improve the corrosion resistance of aluminum coated uranium in the atmosphere is discussed.
- uranium,
- aluminum film,
- circulated argon ion bombardment,
- Auger electron spectroscopy

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