WANG Xin-fu 1,2,3, LU Ting 1,2,3, ZHOU Hong-yu 1,2,3, ZHU Guang-hua 1,2,3, DING Xiao-ji 1,2,3 (1.Key Laboratory Technology and Materials Modifications of Education Ministry, Beijing Normal University, Beijing 100875, China; 2.Institute of Low Energy Nuclear Physics, Beijing Norma. Study of Penetration Depth for V~+ With Low Energy Implanted in Peanut Seeds[J]. Atomic Energy Science and Technology, 2002, 36(6): 531-531. DOI: 10.7538/yzk.2002.36.06.0531
Citation: WANG Xin-fu 1,2,3, LU Ting 1,2,3, ZHOU Hong-yu 1,2,3, ZHU Guang-hua 1,2,3, DING Xiao-ji 1,2,3 (1.Key Laboratory Technology and Materials Modifications of Education Ministry, Beijing Normal University, Beijing 100875, China; 2.Institute of Low Energy Nuclear Physics, Beijing Norma. Study of Penetration Depth for V~+ With Low Energy Implanted in Peanut Seeds[J]. Atomic Energy Science and Technology, 2002, 36(6): 531-531. DOI: 10.7538/yzk.2002.36.06.0531
  • The penetration depth and concentration distribution for vanadium ions with low energy implanted into the dry peanut seeds is determined by scanning electron microscope and X-ray energy dispersion spectrometer. The results show that the depth-concentration distribution is a Gaussian distribution with a long tail and the maximum penetration depth is about 13.6 μm for V + with 200 keV in cotyledon of the peanut. The experimental result of the implanted V + rangen in the peanut seed is compared with the calculating value of the TRIM95.
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