GUO Shi-lun 1, LI Li 1, SHI Yong-qian 1, SHEN Qing-biao 1, WAN Jun-sheng 2, R.Brandt 3, P. Vater 3, B.A. Kulakov 4, M.I. Krivopustov 4, A.N. Sosnin 4 (1. China Institute of Atomic Energy, P.O. Box 275-96,Beijng 102413, China; 2. Northwest Institute of Nuclear Technology, P.O.Box 69-19, Xi'. Experimental Study on Neutronics in Bombardment of Thick Targets by High Energy Proton Beams for Accelerator-driven Sub-critical System[J]. Atomic Energy Science and Technology, 2002, 36(6): 554-554. DOI: 10.7538/yzk.2002.36.06.0554
Citation:
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GUO Shi-lun 1, LI Li 1, SHI Yong-qian 1, SHEN Qing-biao 1, WAN Jun-sheng 2, R.Brandt 3, P. Vater 3, B.A. Kulakov 4, M.I. Krivopustov 4, A.N. Sosnin 4 (1. China Institute of Atomic Energy, P.O. Box 275-96,Beijng 102413, China; 2. Northwest Institute of Nuclear Technology, P.O.Box 69-19, Xi'. Experimental Study on Neutronics in Bombardment of Thick Targets by High Energy Proton Beams for Accelerator-driven Sub-critical System[J]. Atomic Energy Science and Technology, 2002, 36(6): 554-554. DOI: 10.7538/yzk.2002.36.06.0554
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GUO Shi-lun 1, LI Li 1, SHI Yong-qian 1, SHEN Qing-biao 1, WAN Jun-sheng 2, R.Brandt 3, P. Vater 3, B.A. Kulakov 4, M.I. Krivopustov 4, A.N. Sosnin 4 (1. China Institute of Atomic Energy, P.O. Box 275-96,Beijng 102413, China; 2. Northwest Institute of Nuclear Technology, P.O.Box 69-19, Xi'. Experimental Study on Neutronics in Bombardment of Thick Targets by High Energy Proton Beams for Accelerator-driven Sub-critical System[J]. Atomic Energy Science and Technology, 2002, 36(6): 554-554. DOI: 10.7538/yzk.2002.36.06.0554
Citation:
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GUO Shi-lun 1, LI Li 1, SHI Yong-qian 1, SHEN Qing-biao 1, WAN Jun-sheng 2, R.Brandt 3, P. Vater 3, B.A. Kulakov 4, M.I. Krivopustov 4, A.N. Sosnin 4 (1. China Institute of Atomic Energy, P.O. Box 275-96,Beijng 102413, China; 2. Northwest Institute of Nuclear Technology, P.O.Box 69-19, Xi'. Experimental Study on Neutronics in Bombardment of Thick Targets by High Energy Proton Beams for Accelerator-driven Sub-critical System[J]. Atomic Energy Science and Technology, 2002, 36(6): 554-554. DOI: 10.7538/yzk.2002.36.06.0554
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