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ZHAI Peng-ji 1, TANG Xiao-wei 2 (1.Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100080, China; 2.Department of Physics, Zhejiang University, Hangzhou 310027, China). Study on Nano-meter Scale Observation of Latent Tracks Induced by Ions[J]. Atomic Energy Science and Technology, 2002, 36(6): 564-564. DOI: 10.7538/yzk.2002.36.06.0564
Citation: ZHAI Peng-ji 1, TANG Xiao-wei 2 (1.Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100080, China; 2.Department of Physics, Zhejiang University, Hangzhou 310027, China). Study on Nano-meter Scale Observation of Latent Tracks Induced by Ions[J]. Atomic Energy Science and Technology, 2002, 36(6): 564-564. DOI: 10.7538/yzk.2002.36.06.0564
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  • Study on nano-meter scale observation of latent tracks induced by ions are discussed using scanning tunneling microscopy(STM) and scanning force microscopy(SFM). The topography and range of damaged area on the surface of material bombarded by ions and the correlation between damaged number density and ion dose are given. The relationship between diameter of the latent track and energy loss, and the various possible mechanism of damage process are discussed.
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