ZHU Hong-lian, WANG De-wu(Department of Engineering Physics, Tsinghua University, Beijing 100084, China). Ion Collection Simulation by j×B Scheme With Collision and Sputtering[J]. Atomic Energy Science and Technology, 2003, 37(5): 467-467. DOI: 10.7538/yzk.2003.37.05.0467
Citation: ZHU Hong-lian, WANG De-wu(Department of Engineering Physics, Tsinghua University, Beijing 100084, China). Ion Collection Simulation by j×B Scheme With Collision and Sputtering[J]. Atomic Energy Science and Technology, 2003, 37(5): 467-467. DOI: 10.7538/yzk.2003.37.05.0467
  • The paper focuses on the ion collection simulation by j×B scheme with collision and sputtering. The effects of the collector electricity parameters on the collection time, collision and sputtering characteristics are studied. The collecting rate is increased with increasing of the current js and djs/dt, descended with increasing of the plasma density. The influence of the space between collectors is complex, augmenting the space and the collimated empty, improving collecting rate. 
  • loading

Catalog

    Turn off MathJax
    Article Contents

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return