LI Cheng-bo,LIU Zhi-yi,WANG Si-guang,ZHOU Jing,MENG Qiu-ying,ZHOU Shu-hua (China Institute of Atomic Energy,Beijing 102413,China). Measurement of Difference of Half-Life of ~7Be in Be and Au[J]. Atomic Energy Science and Technology, 2005, 39(5): 390-390. DOI: 10.7538/yzk.2005.39.05.0390
Citation: LI Cheng-bo,LIU Zhi-yi,WANG Si-guang,ZHOU Jing,MENG Qiu-ying,ZHOU Shu-hua (China Institute of Atomic Energy,Beijing 102413,China). Measurement of Difference of Half-Life of ~7Be in Be and Au[J]. Atomic Energy Science and Technology, 2005, 39(5): 390-390. DOI: 10.7538/yzk.2005.39.05.0390
  • The half-life T_(1/2) of ~7Be implanted in natural beryllium and natural gold has been measured using two coaxial high-purity germanium detectors to be 53.275(25) d and 53.270(19) d,respectively.No difference in the half-life of ~7Be in the host media beryllium and gold is observed within measurement uncertainty of 0.12%.This result implies that the change of the decay rate of ~7Be implanted in different materials can not be simply expected from the electron affinity difference consideration alone and the(lattice) structure of the host materials should be taken into account.
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