XU Jia-yun1,BAI Li-xin1,WU Wei-dong2,WU Li-ping1,ZHOU Hou-quan1 (1.College of Physical Science and Technology,Sichuan University,Chengdu 610064,China;2.China Academy of Engineering Physics,P.O.Box 919-986,Mianyang 621900,China). Accuracy and Sensitivity of Film Thickness Measurement by Using α-Particle Energy Loss Method[J]. Atomic Energy Science and Technology, 2005, 39(6): 495-495. DOI: 10.7538/yzk.2005.39.06.0495
Citation:
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XU Jia-yun1,BAI Li-xin1,WU Wei-dong2,WU Li-ping1,ZHOU Hou-quan1 (1.College of Physical Science and Technology,Sichuan University,Chengdu 610064,China;2.China Academy of Engineering Physics,P.O.Box 919-986,Mianyang 621900,China). Accuracy and Sensitivity of Film Thickness Measurement by Using α-Particle Energy Loss Method[J]. Atomic Energy Science and Technology, 2005, 39(6): 495-495. DOI: 10.7538/yzk.2005.39.06.0495
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XU Jia-yun1,BAI Li-xin1,WU Wei-dong2,WU Li-ping1,ZHOU Hou-quan1 (1.College of Physical Science and Technology,Sichuan University,Chengdu 610064,China;2.China Academy of Engineering Physics,P.O.Box 919-986,Mianyang 621900,China). Accuracy and Sensitivity of Film Thickness Measurement by Using α-Particle Energy Loss Method[J]. Atomic Energy Science and Technology, 2005, 39(6): 495-495. DOI: 10.7538/yzk.2005.39.06.0495
Citation:
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XU Jia-yun1,BAI Li-xin1,WU Wei-dong2,WU Li-ping1,ZHOU Hou-quan1 (1.College of Physical Science and Technology,Sichuan University,Chengdu 610064,China;2.China Academy of Engineering Physics,P.O.Box 919-986,Mianyang 621900,China). Accuracy and Sensitivity of Film Thickness Measurement by Using α-Particle Energy Loss Method[J]. Atomic Energy Science and Technology, 2005, 39(6): 495-495. DOI: 10.7538/yzk.2005.39.06.0495
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