Advanced Search
XIAO Zhi-gang, TANG Ben-qi, LI Jun-li, ZHANG Yong, LIU Min-bo, WANG Zu-jun, HUANG Shao-yan. Experimental Study on Neutron-Induced Charge Transfer Degradation of Linear Charge Coupled Device[J]. Atomic Energy Science and Technology, 2007, 41(1): 117-120. DOI: 10.7538/yzk.2007.41.01.0117
Citation: XIAO Zhi-gang, TANG Ben-qi, LI Jun-li, ZHANG Yong, LIU Min-bo, WANG Zu-jun, HUANG Shao-yan. Experimental Study on Neutron-Induced Charge Transfer Degradation of Linear Charge Coupled Device[J]. Atomic Energy Science and Technology, 2007, 41(1): 117-120. DOI: 10.7538/yzk.2007.41.01.0117
shu

Experimental Study on Neutron-Induced Charge Transfer Degradation of Linear Charge Coupled Device

    Graphical Abstract
    • Abstract
  • The effect of neutron irradiation on the charge transfer efficiency of the linear CCD(charge coupled device) is studied. The CCD was irradiated by the fast neutron with the fluence of 1012-1013cm-2 from the TRIGA reactor．The charge transfer efficiency of the irradiated linear CCD is linearly decreased with the increase of neutron fluence，and the charge transfer degradation is related to the charge transfer time and the quantity in CCD’s transfer channel．
    • FullText(HTML)
  • loading
    • References (7)
    • Related Articles

Catalog

    Turn off MathJax
    Article Contents

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return