HE Bao-ping, ZHANG Feng-qi, YAO Zhi-bin. Experimental Study on Irradiation Effects of γ, X and Neutron in Floating ROM Devices[J]. Atomic Energy Science and Technology, 2007, 41(4): 489-492. DOI: 10.7538/yzk.2007.41.04.0489
Citation: HE Bao-ping, ZHANG Feng-qi, YAO Zhi-bin. Experimental Study on Irradiation Effects of γ, X and Neutron in Floating ROM Devices[J]. Atomic Energy Science and Technology, 2007, 41(4): 489-492. DOI: 10.7538/yzk.2007.41.04.0489

Experimental Study on Irradiation Effects of γ, X and Neutron in Floating ROM Devices

  • γ-ray,X-ray and neutron irradiation effects of floating ROM devices were measured. The measured results show γ-ray,X-ray and neutron irradiation effects of floating ROM devices are total dose effects. There is a dose threshold when error occurs. At the beginning of error occurrence, the error address and data are random, and the data errors number goes up with the increase of dose or fluence.
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