Experimental Study on Irradiation Effects of γ, X and Neutron in Floating ROM Devices
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Graphical Abstract
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Abstract
γ-ray,X-ray and neutron irradiation effects of floating ROM devices were measured. The measured results show γ-ray,X-ray and neutron irradiation effects of floating ROM devices are total dose effects. There is a dose threshold when error occurs. At the beginning of error occurrence, the error address and data are random, and the data errors number goes up with the increase of dose or fluence.
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