Measurement of Deuterium and Tritium Concentrationin Titanium Film
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Graphical Abstract
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Abstract
The elastic recoil detection (ERD) method was used to measure the concentration of D and T in Ti film. The Ti film with the thickness to be less than 100 nm was deposited on the smooth surface of quartz (SiO2) substrate by means of magnetism sputter method, and covered a nickel layer with the thickness less than 10 nm in order to protect it from oxidizing and enhance the hydrogen charging. Oxygen ion beam of 6.0 MeV was selected as incident ion, and the ERD spectra were detected at the angle of 30°, then the cross-sections for O to D and T are Rutherford cross section under this experiment condition. The D and T concentrations in two samples were measured and the areal density was obtained by means of ERD method. Measurement results show that the measuring errors of D and T concentrations are less than 7%.
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