Study on IDT6116 Single-Event Effect Sensitivity Evaluation Testing Technology

Using single-event effect (SEE) sensitivity evaluation test method and test system as well as three kinds of simulation sources (pulsed laser, heavy ion and ²⁵²Cf),the SEE sensitivity of IDT6116 SRAM was experimentally researched. A comparison of testing results’ equivalent for three kinds of simulation sources was performed. In addition, the influence of total dose effects on SEE was also researched. It is seem that occurred single-event upset probability is very little and the resistence to SEE is better for IDT6116 SRAM.