XIONG Liang-ping, XU Yun-shu. Structural Analysis of Polydimethylsilane Irradiated by Electron Beam[J]. Atomic Energy Science and Technology, 2008, 42(5): 404-407. DOI: 10.7538/yzk.2008.42.05.0404
Citation: XIONG Liang-ping, XU Yun-shu. Structural Analysis of Polydimethylsilane Irradiated by Electron Beam[J]. Atomic Energy Science and Technology, 2008, 42(5): 404-407. DOI: 10.7538/yzk.2008.42.05.0404

Structural Analysis of Polydimethylsilane Irradiated by Electron Beam

  • Polydimethylsilane (PDMS) samples were irradiated by electron beam (EB) in vacuum at room temperature, and the relationship between its structure and absorbed dose was investigated. The result of GC-MS reveals that a small amount of H2and CH4is released. FT-IR, Raman spectra and XRD curves show that the chemical and crystal structure of PDMS are not changed after irradiated with extremely high dose of several MGy. These results indicate that the radiation tolerance of PDMS is excellent, which might be caused by the delocalized σ electron of the highly ordered Si—Si skeletons.
  • loading

Catalog

    Turn off MathJax
    Article Contents

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return