ZENG Sheng, T. Spillane, F. Raiola, C. Rolfs. Measurement of 198Au β--decay half-life in metal Au at low temperature[J]. Atomic Energy Science and Technology, 2009, 43(6): 481-484. DOI: 10.7538/yzk.2009.43.06.0481
Citation: ZENG Sheng, T. Spillane, F. Raiola, C. Rolfs. Measurement of 198Au β--decay half-life in metal Au at low temperature[J]. Atomic Energy Science and Technology, 2009, 43(6): 481-484. DOI: 10.7538/yzk.2009.43.06.0481

Measurement of 198Au β-decay half-life in metal Au at low temperature

  • The 198Au@Au sample was produced via 197Au(n,γ)198Au reaction. The relative activities of 412 keV characteristic γ-ray from the 198Au@Au sample were measured at T=293 K and T=12 K, alternately. The β--decay half-life of 198Au in a Au metallic environment was observed to be longer by (0.4±0.7)% at room temperature (T=293 K) and by (4.0±0.7)% when the metal was cooled to T= 12 K, both compared to the literature value of T1/2 =(2.694 3±0.000 8) d. The result is consistent qualitatively with, but clearly lower than, the prediction of the Debye plasma model.
  • loading

Catalog

    Turn off MathJax
    Article Contents

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return