LI Li-tao, CONG Peng. Scattering Correction of X-ray Thickness Gauge[J]. Atomic Energy Science and Technology, 2009, 43(8): 766-768. DOI: 10.7538/yzk.2009.43.08.0766
Citation: LI Li-tao, CONG Peng. Scattering Correction of X-ray Thickness Gauge[J]. Atomic Energy Science and Technology, 2009, 43(8): 766-768. DOI: 10.7538/yzk.2009.43.08.0766

Scattering Correction of X-ray Thickness Gauge

  • X-ray thickness gauge is a key device for thickness control of the steel plate on the steel mill’s rolling line, and high precision is demanded. X-ray’s scattering is an important factor to affect its precision. The scattering data were measured and analyzed, and its law was concluded by method of mathematic fitting. The scattering influence is corrected according to the law and the error caused by scattering is eliminated effectively.
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