Accelerated Simulation Method to Evaluate Enhanced Low Dose Rate Sensitivity of Bipolar Operational Amplifiers by Decreasing Temperature in Step During Irradiation

A new experimental method was introduced to evaluate enhanced low dose rate sensitivity by decreasing temperature in step during irradiation, and the mechanisms of the experimental phenomena were analyzed. It shows that this new method can perfectly simulate low dose rate damage of bipolar operational amplifiers in real environment, and obviously extend the evaluation total dose of elevated temperature irradiation method proposed in MILSTD883G. Meanwhile, the method can also be an efficient way to quickly determine the enhanced low dose rate sensitivity of bipolar circuits.