Proton Radiation Effects of Charge-Coupled Device

The radiation experiment and measurement were carried out on linearity charge-coupled devices using 1-10 MeV proton provided by 2×6 MV tandem-accelerator of Peking University. The experiment simulation method was set forth on proton radiation effects on charge-coupled devices by accelerator. It was analyzed about the effects of proton fluencies and proton energy and biased cases of devices on charge transfer efficiency and dark current of devices under test. The result shows that charge transfer efficiencies decrease and dark currents increase with proton fluencies increasing and proton energy decreasing at range of 1-10 MeV.