Experimental Study on Single Event Transients of 4N49 Optocoupler

MA Ying-qi; FENG Guo-qiang; AN Guang-peng; ZHANG Zhen-long; HUANG Jian-guo; HAN Jian-wei

doi:10.7538/yzk.2010.44.06.0764

Atomic Energy Science and Technology > 2010 > 44(6): 764-768. > DOI: 10.7538/yzk.2010.44.06.0764

MA Ying-qi, FENG Guo-qiang, AN Guang-peng, ZHANG Zhen-long, HUANG Jian-guo, HAN Jian-wei. Experimental Study on Single Event Transients of 4N49 Optocoupler[J]. Atomic Energy Science and Technology, 2010, 44(6): 764-768. DOI: 10.7538/yzk.2010.44.06.0764

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Experimental Study on Single Event Transients of 4N49 Optocoupler

1.
Center for Space Science and Applied Research, Chinese Academy of Sciences, Beijing 100190, China
2.
Graduate University of Chinese Academy of Sciences, Beijing 100049, China

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Received Date: December 31, 1899
Revised Date: December 31, 1899

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Abstract

The single event transient (SET) effect of the 4N49 optocoupler was tested by pulsed laser experimental methodology. The characteristic of SET as amplitude and width was qualitatively investigated with the simulation of pulsed laser. A liner energy transfer (LET) threshold of 10 MeV•cm²•mg^-1 was measured when the bias voltage was 10 V. The saturated SET cross-section is about 1.2×10^-3cm². The SET effect of 4N49 optocoupler on the following digital gate circuit was validated. The circuit-level design technique for mitigation of SET is reasonable and effective, and the threshold LET of 7.89 MeV•cm²•mg^-12can be improved to 22.19 MeV•cm²•mg^-1. The experiment study on the SET of 4N49 optocoupler provides an appropriate methodology to the SET test of the optics and their hardness assurance.
- pulsed laser,
- optocoupler,
- single event transient

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