ZHU Chuan-xin, ZHENG Pu, GUO Hai-ping, MOU Yun-feng, HE Tie, YANG Jian. Measurement of 176Hf(n, 2n)175Hf Cross Section[J]. Atomic Energy Science and Technology, 2010, 44(增刊): 7-11. DOI: 10.7538/yzk.2010.44.suppl.0007
Citation: ZHU Chuan-xin, ZHENG Pu, GUO Hai-ping, MOU Yun-feng, HE Tie, YANG Jian. Measurement of 176Hf(n, 2n)175Hf Cross Section[J]. Atomic Energy Science and Technology, 2010, 44(增刊): 7-11. DOI: 10.7538/yzk.2010.44.suppl.0007

Measurement of 176Hf(n, 2n)175Hf Cross Section

  • Measurements of 176Hf(n, 2n)175Hf cross sections were carried out in the range of 13.4-14.8 MeV using the activation method and relative measurement technology. The samples were irradiated at the various positions on the ring of a 20 cm radius centered at the D-T neutron source. The 93Nb(n, 2n)92Nbm reaction was used to monitor the neutron flux in the target samples. The (n, 2n) products were measured using calibrated high pure Ge detector. 176Hf(n, 2n)175Hf cross section is (2 100±85) mb at 14 MeV. The results were presented and compared with the references’ results and ENDF/B6.8 evaluations.
  • loading

Catalog

    Turn off MathJax
    Article Contents

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return