Polarization Effect of CdZnTe Imaging Detector Based on High Energy γ Source

The inner electric potential distribution of CdZnTe detector was derived by applying poisson equation with the first type boundary condition, and the polarization effect of CdZnTe pixellated detector for imaging ¹³⁷Cs γ source was investigated. The results of numerical calculation and experiment indicate that electric potential distribution is mainly influenced by applied bias for low charge density in CdZnTe crystal and, in turn, there is linear relationship between electric potential distribution and applied bias that induces uniform electric field under low irradiated flux. However, the electric potential appears polarization phenomenon, and the electric field in CdZnTe crystal is distorted when CdZnTe detector is under high irradiated flux. Consequently, charge carriers in CdZnTe crystal drift towards the edge pixels of irradiated region, and hence, the shut-off central pixels are surrounded by a ring of low counting pixels. The polarization effect indeed deteriorates the performance of CdZnTe detector severely and the event counts of edge pixels for irradiated region reduce about 70%.