Study on Time Response Properties of Ionization Chamber in Profile Gauge

The drift time of ions in the ionization chamber was measured by means of using a shortly pulsed X-ray device and through analyzing the voltage signals on the load resistor of the chamber recorded by a digital oscilloscope. By using this method, the time response properties of the ionization chamber in the profile gauge were studied, results of ion drift time for ionization chambers with different internal structures, different voltages and different gas pressures were introduced and the sources of error were discussed. The experiment results show that the time response of ionization chamber in profile gauge meets the requirement of on-line hot strip measuring.