Pulsed Laser Method for SEE Testing in FPGAs

The pulsed laser method for studying single event effect (SEE) in Virtex-2 FPGA was discussed, and the validity of laser stimulated SEE was evaluated. The laser focusing depth and laser fluence have important impact on the cross section of device under test. With high pulse energy, a single laser pulse could induce multiple-bit upsets (MBU). During irradiation of pulsed laser, the current of chip is increased by 1.2 mA and the chip works normally. A comparison between the results of heavy ion and pulsed laser shows that pulsed laser is valid to simulate SEE like heavy-ion.