Analysis of Affecting Factors of Transient Ionizing Radiation Effects on BiMOS Op-amp by Orthogonal Design

Using the orthogonal design method to arrange tests, a satisfactory result can be acquired with less experiments. The transient ionizing radiation effects experiments on BiMOS op-amp CA3140 were done on “Qiangguang-1” accelerator in this work to study the impact of different factors on the recovery time of CA3140 by transient ionizing irradiation. The sub-sequence and the significant level of the factors for the recovery time, as well as the worst bias conditions for CA3140 under transient ionizing irradiation were obtained.