Development of Test System for Transient Ionizing Radiation Effects on SRAM-Based FPGA Based on Radiation Evade Mechanism

A method was introduced to realize the configuration memory test on SRAM-based FPGA in the transient ionizing radiation environment. Applying radiation evade mechanism to the test of transient ionizing radiation effects on SRAM-based FPGA, an online test system in which peripheral test circuits evaded the pulse interferes was designed. Based on the established test system, experiments were performed on FPGA using “Qiangguang I” accelerator. Results show that the test system can test the configuration memory accurately and reliably, and radiation evading is an efficient mean to realize the test on large scale integrated circuits in transient ionizing radiation effects.