Total Ionizing Dose Effect on 12-bit LC₂MOS Digital to analog Converter

12-bit digital-to-analog converter（DAC） in LC₂MOS technology was irradiated by ⁶⁰Co γ ray at high and low dose rates under two bias conditions to investigate total ionizing dose effect of the DAC. The results show that the DAC in LC₂MOS technology is sensitive to dose rates, and radiation failure level is more significant at high dose rate compared to low dose rate. Under different bias conditions, the radiation failure levels are different, and the radiation damage under the operating bias condition is more severe.