Production Yield of C-H Cluster From Carbon Material Bombarded by MeV Ions

Using the time-of-flight secondary ion mass spectrometry method, the production yield of C-H cluster from carbon material bombarded by MeV ions was investigated. In the experiment, Si⁺ and Au²⁺ ions generated by the 2×1.7 MV tandem accelerator of Peking University were chosen as the primary ion beams. The mass of the secondary ion was calibrated by the sample with known mass. By analyzing the mass spectrum of the secondary ion bombarded by different ions, it is found that the yield is related to the lateral straggling of ions in the material at this energy region.