CAO Lin-yuan, TIAN Jue, XIN Chang-sheng, WANG Hui. Analysis of Reasons for Abnormal Enrichment of Silica in Pressurized Water Reactor[J]. Atomic Energy Science and Technology, 2014, 48(增刊1): 540-544. DOI: 10.7538/yzk.2014.48.S0.0540
Citation: CAO Lin-yuan, TIAN Jue, XIN Chang-sheng, WANG Hui. Analysis of Reasons for Abnormal Enrichment of Silica in Pressurized Water Reactor[J]. Atomic Energy Science and Technology, 2014, 48(增刊1): 540-544. DOI: 10.7538/yzk.2014.48.S0.0540

Analysis of Reasons for Abnormal Enrichment of Silica in Pressurized Water Reactor

  • The SiO2 leaching behavior and mechanism of glass filter element were studied using static immersion method. The effects of temperature, pH value of the coolant and filter accuracy on the evolution of SiO2 were investigated. The results show that the rate of SiO2 evolution rapidly decreases and tends towards stability over 60 day attributed to the formed colloid stable film on the surface of filter. The rate of SiO2 evolution obviously increases with the temperature. It’s 0.009 8 g/(m2•d) at 298 K, and about an order of magnitude lower than that at 343 K (0.204 g/(m2•d)), demonstrating the process of SiO2 evolution is not simple ion diffusion or dissolution reaction, but controlled by both reactions, even more complex. At the same condition, the higher the filter accuracy is, the faster the rate of SiO2 evolution is.
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