ZHANG Hong-kai, FENG Zhao-dong, LI Xiao-hui, DU Qiu-yu, WEI Shu-jun, LIU Shuang-quan, QIN Xiu-bo, WEI Cun-feng, WEI Long. Development and Performance Evaluation of Read-out Electronics System for High Resolution X-ray Detector[J]. Atomic Energy Science and Technology, 2015, 49(3): 534-539. DOI: 10.7538/yzk.2015.49.03.0534
Citation: ZHANG Hong-kai, FENG Zhao-dong, LI Xiao-hui, DU Qiu-yu, WEI Shu-jun, LIU Shuang-quan, QIN Xiu-bo, WEI Cun-feng, WEI Long. Development and Performance Evaluation of Read-out Electronics System for High Resolution X-ray Detector[J]. Atomic Energy Science and Technology, 2015, 49(3): 534-539. DOI: 10.7538/yzk.2015.49.03.0534

Development and Performance Evaluation of Read-out Electronics System for High Resolution X-ray Detector

  • An electronics system was developed according to the low noise requirement of FOT X-ray detector in this paper. The electronics system consists of an analog drive circuit, a front end processing circuit and a digital signal processing circuit which is based on field programmable gate array (FPGA). The performance of FOT X-ray detector was evaluated on the X-ray imaging platform. The overall system gain is 0.168 6 DN/e-, and the linear operating range of the detector is 0.154 μGy. When the cooling temperature reaches -20 ℃, the dark current noise is 0.037 e-/(pixel•s) and the read noise is 10.9 e-. The intrinsic spatial resolution of the detector is 16 lp/mm. The results indicate that the designed read-out electronics system meets the requirements of high resolution X-ray detector.
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