Analysis on Method to Improve Output Characteristic of CeF₃ Scintillation Detector

For a common CeF₃ scintillation detector, since the optical spectrum of CeF₃ does not match the optical spectrum of the photoconducting device closely, the main output characteristics, namely, output level and pulse waveform, will be deformed and cannot be used to deduce the true characteristic of the radiation source. In this work, after literature survey and sample comparing, it is found that it is effective to add a wave-shifting wafer between the CeF₃ and the photoconducting device. As is shown in principle analysis and experiment results, the wave-shifting wafer method can improve the output characteristic of a CeF₃ scintillation detector observably. The output level-increases by over 50% and the pulse time response changes to 3 ns from 12 ns after the wave-shifting wafer method is used.