Development of Peristaltic Device for Solution Sample Measurement by Synchrotron Radiation Small-angle X-ray Scattering

A peristaltic device for solution sample measurement applied in small angle X-ray scattering at synchrotron radiation was developed. The radiation damage can be efficiently restrained by using this device whose features are good sealing, easy operation, low background scattering, small sample consumption, and the sample temperature can be controlled for in-situ measurement. The sample volume and peristaltic rate of the device were calibrated, and the validity of reducing radiation damage was also verified. The results indicate that this peristaltic device is an effective tool for precise X-ray scattering measurements with high control accuracy.