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WANG Zhong-ming, YAN Yi-hua, CHEN Rong-mei, WANG Yuan-ming, ZHAO Wen, ZHANG Feng-qi, GUO Xiao-qiang, GUO Hong-xia. Development of Single-event Effect Test System for Flash-based FPGA[J]. Atomic Energy Science and Technology, 2015, 49(12): 2266-2271. DOI: 10.7538/yzk.2015.49.12.2266
Citation: WANG Zhong-ming, YAN Yi-hua, CHEN Rong-mei, WANG Yuan-ming, ZHAO Wen, ZHANG Feng-qi, GUO Xiao-qiang, GUO Hong-xia. Development of Single-event Effect Test System for Flash-based FPGA[J]. Atomic Energy Science and Technology, 2015, 49(12): 2266-2271. DOI: 10.7538/yzk.2015.49.12.2266
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Development of Single-event Effect Test System for Flash-based FPGA

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  • A single-event effect test system for Flash-based FPGA was developed. The system can be used for SRAM/Flash ROM single-event upset effect test, D-flip flop single event effect test, PLL and clock network single-event transient effect test, and single-event transient pulse width test. The test methods and hardware/software solutions were described in this paper.
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