Study on Impurity Elimination System for Dual-beam Accelerator

A set of impurity elimination system for dual-beam accelerator was developed. This system consists of two Wien filters, one Einzel lens and a slit with two apertures. The two ion beams with different mass-to-charge ratios can be generated in the same ion source and transported in the same beam line simultaneously without impurity. The impurity ions can be eliminated by the slit after the first Wien filter. The beams of H⁺₂ and He⁺ can be produced simultaneously and injected into the target coaxially. The purity of the ion beam on the target is better than 99.9%.