Effect of Temperature Switching Irradiation on Single Event Transient in Bipolar Voltage Comparator LM2903 under Different Bias States

The synergistic effect of total ionizing dose (TID) and single event transient (SET) in bipolar voltage comparator LM2903 was studied by temperature switching irradiation method which can simulate low-dose-rate irradiation. The result shows that TID has a suppressing effect on the SET of LM2903 at the high-level working state for bias voltage, and TID can promote the SET of LM2903 at the low-level working state for bias voltage. The interface state defect charge induced by ionizing irradiation is the fundamental cause of the synergistic effect of TID-SET. The output stage structure of voltage comparator causes different effects of the bias state on the synergistic effect of TID-SET.