Statistical Method for Single Event Multiple Cell Upset Extraction

In the evaluation of electronic device for aerospace and avionics systems, the multiple cell upset (MCU) of the device should be considered. The main difficulty in MCU extraction is the lack of layout information. In this paper, a statistical method was proposed to extract MCU from single event upset (SEU) without layout information. Firstly, a MCU template was extracted by means of statistical analysis of the binary exclusive OR and the binary Hamming distance between the logical addresses of different upsets. Then the MCU could be extracted by using the MCU template. Heavy ion test data of an interleaved SRAM were used to verify the method. The results show that MCU can be extracted with a high accuracy. Using the proposed method, the time and cost of reverse engineering can be saved, and the efficiency of related scientific research can be significantly improved.