X射线荧光分析中基本参数法的应用

APPLICATION OF THE FUNDAMENTAL-PARAMETERS METHOD IN X-RAY FLUORESCENCE ANALYSIS

摘要: 文章使用基本参数法,对合金钢样品不经化学处理,不使用参考标准,样品在同位素源激发的Si(Li)X射线荧光谱仪上进行测量,将测量结果送入同多道联机的EMG 666微机上进行计算,最后打印出分析结果。文中对入射角的变化,一次荧光效应和二次荧光效应,散射效应进行了研究,并对合金钢样进行了分析。用标准样品检验,表示分析准确度的相对误差小于±3％;表示方法精密度的相对偏差小于±6％。
- X射线荧光分析 ,
- 基本参数法
Abstract: Alloy samples are excited with the radioisotope source and measured by x-ray spectrometer using the fundamental-parameters method without chemical treatment and refernce standared material. The data are processed by the microcomputer-EMG666. The change of the incident angles, the first fluorescent effect,the secondary fluorescent effect and scattering effect are studied. The accuracy and the precision of this method is less than ±3% and ±6%, respectively.
- X-ray spectrometer ,

[1]	Criss, T. W., Birks, L. S., Anal. Chem., 4O, 1080 (1968).
[2]	Katrumi Qnno, et al., X-Ray Spectr., 9 (3), 138, (1980).
[3]	Mantle, M. and Ebel, H., X-Ray Spectr., 9 (3), 146 (1980).
[4]	吉昂等,光谱学与光谱分析,1(3), 38(1983) .
[5]	陈志祥,核技术,1,20(1982) .
[6]	Shiraiwa, T. and Fujino, N., Jap. J. Appl. Phys., 5, 886 (1966).
[7]	Shiraiwa, T. et al., X-Ray Spectr., 3, 64 (1974).
[8]	舒培桂等,X射线荧光分析中基本参数法及计算程序,第三次全国活化分析会议资料,1984.
[9]	Mcmaster, W. H. et al., UCRL-50174, Sec, Rev, 1 (1970).