用分光光度计测量核靶厚度和均匀性
THE THICKNESS MEASUREMENTS OF TARGETS WITH SPECTROPHOTOMETER
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摘要: 文章叙述了吸光光度法测量核靶厚度和均匀性的一般原理,并给出碳膜和金属膜的具体测量方法,本方法的厚度测量范围为5—200μg/cm~2,测量精度为10%。Abstract: A method for measuring the thickness of thin targets with a spectrophotometeris described. The principle of the method and the instrument used are mentioned.The relation between thickness and absorption for carbon, gold and copper foilsare given.