硅半导体二重符合反冲质子望远镜
Si SEMICONDUCTOR DOUBLE COINCIDENCE RECOIL PROTON TELESCOPE
-
摘要: 文章叙述半导体二重符合反冲质子望远镜的调试和在14MeV中子源上与伴随粒子法的比对测量。Abstract: The paper describes the adjustment of a semiconductor double coincidencerecoil proton telescope and the intercomparison with associated particle method at14 MeV neutron source.