硅半导体二重符合反冲质子望远镜

Si SEMICONDUCTOR DOUBLE COINCIDENCE RECOIL PROTON TELESCOPE

  • 摘要: 文章叙述半导体二重符合反冲质子望远镜的调试和在14MeV中子源上与伴随粒子法的比对测量。

     

    Abstract: The paper describes the adjustment of a semiconductor double coincidencerecoil proton telescope and the intercomparison with associated particle method at14 MeV neutron source.

     

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