带电粒子轨迹的随机跟踪与图形分析

doi:10.7538/yzk.1990.24.05.0046

带电粒子轨迹的随机跟踪与图形分析

@林晓梅 $华南工学院!广州@茅乃丰$ 中国原子能科学研究院!北京@陈静娴$华南工学院!广州

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出版历程
- 收稿日期: 1988-03-21
- 刊出日期: 1990-09-19

RANDOM RAY-TRACING AND GRAPHIC ANALYSING OF CHARGED PARTICLE TRAJECTORIES

LIN XIAOMEI;MAO NAIFENG;CHEN JINGXIAN China Institute of Atomic Energy, P.O. Box 275, Beijing On leave from South China Institute of Technology, Guangzhou

摘要

摘要: 为了真实地描述带电粒子束的光学特性,文章对粒子轨迹跟踪中粒子初始条件的随机抽样进行了探讨。粒子的发射面包括平面、圆柱面和球面;分布函数既可由解析形式表示,又可由数值形式给出。其次,为了有效地利用轨迹跟踪结果对带电粒子束特性进行系统的分析,文章还探讨了粒子轨迹的图形处理和分析,内容包括轨迹的样条拟合、轨迹和束包络图形的绘制、象的尺寸及其位置的确定,以及任意横截面上粒子分布图形的绘制。
- 轨迹跟踪 ,
- 随机抽样 ,
- 图形处理与分析
Abstract: In order to describe the optical properties or a charged particle beam reali-stically, the random sampling of initial conditions of particles in ray-tracing isdiscussed in the paper. The emission surface of particles may be a plane. acylindrical surface or a spherical surface. The distribution functions may beexpressed analytically or numerically. Next, in order to analyse the properties ofthe charged particle beam systematically by use of the results from ray-tracingefficiently, the graphic processing and analysing of particle trajectories are alsodiscussed, including the spline function fitting of trajectories. the graphic draftingof trajectories and beam envelopes, the determining of image dimensions and thecorresponding positions, and also the graphic drafting of particle distributionson arbitrary cross sections.
- Ray-tracing ,
- ,
- Random sampling

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参考文献(4)

[1]	Spencer, J. E. and Enge, H. A. Nucl. Instrum. and Methods, 49, 181(1967).
[2]	Enge, H. A. and Kowalski, S. B. proc. Thind Int. Conf. on Magnet Technology, 366(1970).
[3]	茅乃丰,带电粒子光学系统设计和计算机程序,中国原子能科学研究院,1981年.
[4]	裴鹿成、张孝泽,蒙特卡罗方法及其在粒子输运问题中的应用,科学出版社,1980年。