单束团运行模式下影响直流流强检测器的机理分析及改进措施

MECHANISM ANALYSIS AND IMPROVING METHODS OF AFFECTING DC CURRENT TRANSFORMER(DCCT) UNDER SINGLE BUNCH OPERATION

摘要: 分析了合肥800MeV电子储存环单束团运行模式下影响直流流强检测器（DCCT）的机理，并提出了几种改进措施。采用了增加陶瓷狭缝电容的措施，保证了DCCT在单束团工作模式下的正常工作，并给出了测试结果。

Abstract: The mechanism of affecting DC current transformer(DCCT) is analyzed for Hefei 800 MeV electronic storage ring under single bunch operation. The several methods of improving DCCT are presented. The method of increasing ceramic gap capacitance is used, which ensure DCCT operate well under single bunch operation. The measurement results are given.